This VLSI Quiz offers a diverse set of commonly asked questions covering digital design, CMOS logic, timing analysis, and verification concepts. Ideal for candidates preparing for VLSI interviews seeking to assess and enhance their technical understanding in real-world scenarios.
In VLSI design, which of the following best describes a primary distinction between combinational and sequential logic circuits?
Explanation: The key difference is that sequential circuits possess memory elements, allowing them to store state, while combinational circuits only produce outputs based on current inputs. Contrary to option A, combinational circuits do not require a clock signal, but sequential circuits often do. Option C is incorrect since sequential outputs depend on past and present inputs. Option D is actually reversed; feedback paths are typical in sequential circuits, not in combinational ones.
If a CMOS inverter shows a slow rising output edge during simulation, which adjustment would most effectively improve the rise time?
Explanation: Increasing the width of the PMOS transistor improves its ability to source current, speeding up the rising edge. Decreasing NMOS length typically affects fall time more than rise time. Increasing NMOS width impacts the fall edge, not the rise edge. Decreasing PMOS width would worsen the rise time, making it even slower.
During static timing analysis, a flip-flop receives data that arrives 0.3 ns after the setup time requirement, causing a setup time violation. What is a likely consequence of this event?
Explanation: A setup time violation means the input data may not be properly latched, potentially resulting in metastability—where the output is unpredictable. The data is not reliably captured (option A), and increasing the clock frequency would make violations more likely (option B). The violation does not increase the hold time margin; that's unrelated to setup time (option D).
While testing a scan-based design, a stuck-at-1 fault is detected in a scan chain. What does this imply during VLSI verification?
Explanation: A stuck-at-1 fault means a node, such as a flip-flop, is always at logic high and cannot change to low, indicating a fault in the scan cell. Option A incorrectly describes a stuck-at-0 fault. Scan enable being deactivated (option C) would prevent testing but not indicate a stuck value. The scan clock frequency (option D) does not determine whether a fault exists, though it could affect detectability.
Which factor most directly increases dynamic power consumption in a VLSI digital circuit, given the formula P = αCV²f?
Explanation: Dynamic power is directly proportional to switching activity, load capacitance, supply voltage squared, and clock frequency. Increasing clock frequency (f) therefore increases dynamic power most directly among the options. Decreasing α, lowering V, or reducing C would all decrease power consumption, not increase it.